Automatic Test Cells
Modules testing: High Power Modules test cell
- SCARA robot based motion system
- Optional tools, nozzles, grippers, based on device type
- Heating (up to 200°C) and cooling (25°C) plates available
- Specific contacting unit for power devices (High Voltage /High Current)
- Full system integration to reduces connection parasitic effects
- Fully programmable output sorting (up to 4 different categories)
- Ready for Factory automation (STDF compliant, SECS GEM and MES optional)
- Fully integrated Tester-Handler SW protocol
- Easy to use SW based on touch screen
- Multilevel password access
Chip testing: KGD test cell
- Distributed synchronized motion and vision control system
- Multiple up or down looking, moving or fix installed cameras (GigE) Head- and table peripherals from flexible component matrix
- Optional tools, nozzles, grippers (changers, heaters, force systems)
- Specific contacting unit for HV devices
- Optional conveyors, tape- and stick feeders, vibratory-, any-feed-, wafer and waffle-pack feeders
- Full system integration to reduces connection parasitic effects
- Fully programmable output sorting (up to 4 different categories)
- Ready for Factory automation (STDF compliant, SECS GEM and MES optional)
- Fully integrated Tester-Handler SW protocol
- Easy to use SW based on touch screen
- Multilevel password access
Discrete devices: TO247 test cell
- Flexible feeding type trolley based (possible to change magazine setup in 5 minutes: Tube2Tube to Jedec2Jedec or Blister)
- Sensorized pickup tool for accurate device pickup and placement
- High Tester-Handler integration level to reduces connection parasitic effects
- Double pick up tool and double device socket to optimize handling time
- Optical check for 2D code check on socket (to automatically verify the right configuration recipe-socket)
- Fully programmable reject bin in Box (up to 5 different boxes)
- Ready for Factory automation (STDF compliant, SECS GEM and MES optional)
- Fully integrated Tester-Handler SW protocol
- Easy to use SW based on touch screen
- Multilevel password access
- ESD Compliance with ionizer
Automatic Test Cells – MTS100SW
STATIC VERIFICATIONS:
- Iges,Igds,Vgeth,Vgsth: ± 30V/1A or ± 50V/0.1A
- Ices,Idrm,Irrm, Bvces,Vrrm,Vdrm: 2.3KV /50mA or 7.5KV/10mA
- Vceon/Vdson, Vf: up 200A/10V)
- Kelvin tests performed continuity check
- Up to 100 tests in a single run
- Results data collection, export and statistical analysis, BIN summary, Wafer summery
- Flexible Test program: test sequence based on partial results (Jump on Pass/Fail)
- Classes can be defined upon test results using the Matching editor.
- TTL/GPIB wafer prober interface